Instantaneous phase shifting arrangement for microsurface profiling of flat surfaces-Reference-Cited by-同舟云学术

Instantaneous phase shifting arrangement for microsurface profiling of flat surfaces

Published:2001-04 Issue:1-6 Volume:190 Page:109-116
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Ngoi B.K.A.,Venkatakrishnan K.,Sivakumar N.R.,Bo T.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

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2. Instantaneous phase measuring interferometry;Smythe;Optical Engineering,1984

3. R.S. Sirohi, F.S. Chau, Optical Methods of Measurement: Wholefield Techniques, Marcel Dekker, New York, 1999

4. C.L. Gary, Optical Methods of Engineering Analysis, Cambridge University Press, Cambridge, 1995

5. Vibration in phase-shifting interferometry;Groot;Optical Society of America A,1995

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