Author:
Murakowski Janusz,Cywiak Moisés,Rosner Björn,van der Weide Daniel
Subject
Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Optical Measurement Techniques and Applications;Rastogi,1997
2. Introduction to Surface Roughness and Scattering;Bennett,1989
3. Absolute measurement of surface roughness
4. Reference-beam system for measuring relative small-surface local irregularities of a reflective object
5. M. Cywiak, J. Murakowski, G. Wade, Beam blocking method for optical characterization of surfaces, Int. J. Img. Sys. Tech., to be published
Cited by
11 articles.
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