Author:
Kim Seunghyeon,Noh Yung-Kyun,Park Frank C.
Subject
Artificial Intelligence,Cognitive Neuroscience,Computer Science Applications
Reference53 articles.
1. Wavelets and their applications for surface metrology;Jiang;CIRP Ann.,2008
2. Visual inspection of machined metallic high-precision surfaces;Pernkopf;EURASIP J. Adv. Signal Process.,2002
3. F. Timm, E. Barth, Non-parametric texture defect detection using weibull features, in: Proc. of the SPIE, 2011, p. 78770J.
4. H. G. da Silva, T. G. Amaral, O. P. Dias, Automatic optical inspection for detecting defective solders on printed circuit boards, in: Proc. of the 36th Annual Conference on IEEE Industrial Electronics Society, 2010, pp. 1087–1091.
5. Statistical threshold method for semiconductor inspection;Hamamatsu,2006
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