Diffusion length analysis and measurement in the base region of photodiodes
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Reference13 articles.
1. A method for determining the emitter and base lifetimes in p-n junction diodes
2. Diffusion lengths in solar cells from short‐circuit current measurements
3. Diffusion length and lifetime determination in p-n junction solar cells and diodes by forward-biased capacitance measurements
4. R.O. Bell, G.M. Freedman, in: Proceedings of the 13th IEEE Photovoltic Specialists Conference, IEEE, New York, 1978, pp. 89.
5. Measurement of minority carrier lifetime in solar cells from photo-induced open-circuit voltage decay
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