Subject
Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
5 articles.
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1. Surface Topography Measurement Using Digital Moirè Contouring—Errors and Limitations;Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture;1995-08
2. Holographic, speckle and moiré techniques in optical metrology;Progress in Quantum Electronics;1993-01
3. Subcoded information carriers: hybrid moiré system;Journal of the Optical Society of America;1983-09-01
4. Sign determination of contour lines;Optics Communications;1975-11
5. Optical Image Subtraction;Optical Engineering;1975-10-01