The use of lateral waves for the examination of weakly absorbing surface films-Reference-Cited by-同舟云学术

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The use of lateral waves for the examination of weakly absorbing surface films

Published:1976-06 Issue:3 Volume:17 Page:339-341
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Heavens O.S.,Sharma S.K.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. Waves in Layered Media;Brekhovskikh,1960

2. Role of the Lateral Wave in Total Reflection of Light*

3. The Propagation of Lateral Waves in Absorbing Media and Thin Films

4. Lateral waves on a plane air–water interface*

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Defect Formation in Alkali Halide Crystals;Self-Trapped Excitons;1996

2. Defect Formation in Alkali Halide Crystals;Self-Trapped Excitons;1993

3. Electronic structure of point defectson insulator surfaces;Progress in Surface Science;1981-01

4. Internal-Reflection-Spectroscopy Studies Of Thin Films And Surfaces;Optical Engineering;1978-10-01

5. Resonant internal-reflection prism spectroscopy using surface, guided, and Fabry-Perot EM waves;Applied Optics;1978-02-01

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