Speckle-pattern interferometry applied to the study of phase objects
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Observation of a phase object using carrier-frequency photography
2. S. Mallick, Opt. Acta, to be published.
3. Production of Multiple Beam Fringes from Photographic Scatterers
4. Interference and Diffraction Phenomena Produced by a New and Very Simple Method
5. Recording of In-plane Surface Displacement by Double-exposure Speckle Photography
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