Author:
Adams J.R.,Zeidler J.R.,Bashara N.M.
Subject
Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. Ellipsometry in the Measurement of Surface and Thin Films,1964
2. Recent Developments in Ellipsometry,1969
3. Parameter-Correlation and Computational Considerations in Multiple-Angle Ellipsometry*
4. Optical Properties of Metals;Sokolov,1967
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