Interferometric frequency measurements of 130Te2 transitions at 486 nm

Author:

Barr J.R.M.,Girkin J.M.,Ferguson A.I.,Barwood G.P.,Gill P.,Rowley W.R.C.,Thompson R.C.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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