Resonant inelastic soft X-ray scattering at the Si L3 edge: experiment and theory-Reference-Cited by-同舟云学术

Resonant inelastic soft X-ray scattering at the Si L3 edge: experiment and theory

Published:1998-06 Issue:1-3 Volume:93 Page:245-250
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Eisebitt S.,Lüning J.,Rubensson J.-E.,Settels A.,Dederichs P.H.,Eberhardt W.,Patitsas S.N.,Tiedje T.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference24 articles.

1. Proceedings of the Intl. Workshop on RIXS, Walberberg, Germany 1996, Applied Physics A, 65 (1997).

2. X-ray absorption, emission, and resonant inelastic scattering in solids

3. Excitation-energy dependence in theL2,3fluorescence spectrum of Si

4. Soft-x-ray resonant inelastic scattering at the CKedge of diamond

5. Observation of resonant Raman scattering at the SiL2,3core exciton

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