Study of different forms of carbon by analytical electron microscopy-Reference-Cited by-同舟云学术

Study of different forms of carbon by analytical electron microscopy

Published:1999-07 Issue:1-3 Volume:104 Page:61-66
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Duarte-Moller A.,Espinosa-Magaña F.,Martínez-Sanchez R.,Avalos-Borja M.,Hirata G.A.,Cota-Araiza L.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. Extended energy loss fine structure measurement above shallow and deep core levels of 3d transition metals

2. Structural determination of crystalline silicon by extended energy-loss fine-structure spectroscopy

3. Extended energy loss fine structures (EELFS): A new structural probe for surfaces and interfaces

4. Local structure of graphite by EELFS spectroscopy: Influence of multiple plasmons and orientational dependence

5. Structural and electronic studies of clean and oxidized thin Fe films on polycrystalline copper

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