A HREM study of the atomic structure and the growth mechanism at the YBa2Cu3O7/YSZ interface-Reference-Cited by-同舟云学术

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A HREM study of the atomic structure and the growth mechanism at the YBa2Cu3O7/YSZ interface

Published:1993-12 Issue:1-2 Volume:218 Page:29-42
ISSN:0921-4534
Container-title:Physica C: Superconductivity
language:en
Short-container-title:Physica C: Superconductivity

Author:

Wen J.G.,Traeholt C.,Zandbergen H.W.,Joosse K.,Reuvekamp E.M.C.M.,Rogalla H.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference25 articles.

1. High critical currents in strained epitaxial YBa2Cu3O7−δon Si

2. Epitaxial YBa2Cu3O7−δon GaAs(001) using buffer layers

3. Epitaxial yttria‐stabilized zirconia on (11̄02)sapphire for YBa2Cu3O7−δthin films

4. Epitaxial YBa2Cu3O7−δ films on silicon using combined YSZ/Y2O3 buffer layers

5. Observation of two in‐plane epitaxial states in YBa2Cu3O7−δfilms on yttria‐stabilized ZrO2

Cited by 35 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fabrication of YBa₂Cu₃O₇ Superconducting Nanocomposite Film on Silicon Substrate;ACS Applied Electronic Materials;2024-06-03

2. Atomic interface sequence, misfit strain relaxation and intrinsic flux-pinning defects in different YBa2Cu3O7−δheterogeneous systems;Superconductor Science and Technology;2012-12-18

3. Tailoring in-plane crystallographic orientation of epitaxial YBa2Cu3O7−x thin films having perpendicular c-axis texture;Thin Solid Films;2012-02

4. Structural characterization of La0.9Ba0.1MnO3/Y-ZrO2 film by X-ray diffraction;Physica B: Condensed Matter;2011-11

5. Highly heteroepitaxial thin films of YBa2Cu3Oy grown on silicon with Eu2CuO4/Y-ZrO2 bi-layer buffer;Thin Solid Films;2008-07

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