1. Test design modeled by finite-state machines;Chow;IEEE Trans. Softw. Eng.,1978
2. M.P. Vasilevskii, in: Failure Diagnosis of Automata, Translated from Kibernetika, vol. 4, 1973, pp. 98–108.
3. Test selection based on finite state models;Fujiwara;IEEE Trans. Softw. Eng.,1991
4. A protocol test generation procedure;Sabnani;Comput. Networks ISDN Syst.,1988
5. S.T. Vuong, W.W.L. Chan, M.R. Ito, The UIOv-method for protocol test sequence generation, in: Proc. of the IFIP TC6 2nd IWPTS, North-Holland, 1989, pp. 161–175.