Integrating in-process software defect prediction with association mining to discover defect pattern

Author:

Chang Ching-Pao,Chu Chih-Ping,Yeh Yu-Fang

Publisher

Elsevier BV

Subject

Computer Science Applications,Information Systems,Software

Reference47 articles.

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2. Experiences with defect prevention;Mays;IBM System Journal,1990

3. Orthogonal defect classification – a concept for in-process measurements;Chillarege;IEEE Transactions on Software Engineering,1992

4. Classification and evaluation of defects in a project retrospective;Leszak;The Journal of System and Software,2002

5. Classification-tree models of software-quality over multiple releases;Khoshgoftaar;IEEE Transactions on Reliability,2000

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