STM on cracks in brittle materials
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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1. Imaging atomically sharp crack tips in mica by contact mode AFM under ambient conditions;The European Physical Journal Applied Physics;2005-04-14
2. Fractal structure and fractal dimension determination at nanometer scale;Science in China Series A: Mathematics;1999-09
3. Atomic structure of loaded crack tip by AFM;Scripta Materialia;1998-10
4. Investigation of atomic structure ahead of crack tip by STM and AFM;Science in China Series E: Technological Sciences;1998-08
5. Deformation processes at crack tips in NiAl single- and bicrystals;Materials Science and Engineering: A;1997-12
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