Author:
Perovic D.D.,Castell M.R.,Howie A.,Lavoie C.,Tiedje T.,Cole J.S.W.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. Microscopy of Semiconducting Materials 1993,1993
2. High-resolution scanning electron microscopy
3. Proc. 46th Annual EMSA Meeting;Ogura,1988
Cited by
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