Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
33 articles.
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1. TEM Applications of EELS;Electron Energy-Loss Spectroscopy in the Electron Microscope;2011
2. Energy-Loss Instrumentation;Electron Energy-Loss Spectroscopy in the Electron Microscope;2011
3. A Scan Through the History of STEM;Scanning Transmission Electron Microscopy;2010-12-16
4. Chapter 9 Scanning Transmission Electron Microscopy;Advances in Imaging and Electron Physics;2009
5. Determination of quantitative distributions of heavy-metal stain in biological specimens by annular dark-field STEM;Journal of Structural Biology;2008-04