A comparative study of microstructure (in ITO films) and techniques (CTEM and STM)
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. P.H. Gaskell and R.G. Geere, Riv. Stazione Sper. Del Vetro, in press.
2. Electro-optical properties of thin indium tin oxide films: Limitations on performance
3. The electrical properties of polycrystalline silicon films
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2. The effects of various annealing regimes on the microstructure and physical properties of ITO (In2O3:Sn) thin films deposited by electron beam evaporation for solar energy applications;Renewable Energy;2011-04
3. Crystallisation of indium-tin-oxide (ITO) thin films;Renewable Energy;2004-10
4. Composition, structure and properties of the oxide films formed on the stainless steel 316L in a primary type PWR environment;Corrosion Science;1998-02
5. Observation of deviation of electronic behaviour of indium tin oxide film at grain boundary using Scanning Tunneling Microscope;Solid State Communications;1997-03
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