Local quantification of the composition in GaAs/AlxGa1−xAs structures by thickness fringe analysis
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. A model for GRIN-SCH-SQW diode lasers
2. Compact visible microgun-pumped Cd Te-Cd1−xMnxTe laser
3. Quantitative chemical lattice imaging: theory and practice
4. New methods for qualitative and quantitative analysis of the GaAs/AlGaAs interface by high-resolution electron microscopy
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Mechanical Preparation Techniques;Sample Preparation Handbook for Transmission Electron Microscopy;2010
2. Compositional analysis of graded Al[sub x]Ga[sub (1−x)]As layers by x-ray energy dispersive spectrometry;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2004
3. Determination of Al compositional profiles across AlAs/GaAs heterostructural interface at sub-nanometer spatial resolution by thickness fringe imaging;Scripta Materialia;2002-08
4. Theoretical and experimental limits of the analysis of III/V semiconductors using EELS;Micron;2000-08
5. Comparison of in situ optical reflectance and post-growth characterisation for quantitative composition and thickness determination of AlxGa1-xAs;Vacuum;1999-05
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3