Applications of the near-edge and low-loss fine structure in the analysis of diamond-Reference-Cited by-同舟云学术

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Applications of the near-edge and low-loss fine structure in the analysis of diamond

Published:1989-04 Issue:1-4 Volume:28 Page:43-46
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Berger S.D.,Bruley J.,Brown L.M.,McKenzie D.R.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. On voidites: a high-resolution transmission electron microscopic study of faceted void-like defects in natural diamonds

2. K-shell excitation spectra of CO, N2 and O2

3. J. Bruley and L.M. Brown, Phil. Mag., in press.

4. EELS analysis of vacuum arc-deposited diamond-like films

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1. Controlled glow to arc transition in sputtering for high rate deposition of carbon films;Diamond and Related Materials;2011-02

2. Theory of surface plasmons and surface-plasmon polaritons;Reports on Progress in Physics;2006-12-07

3. The nature of molecular cloud material in interplanetary dust;Geochimica et Cosmochimica Acta;2004-06

4. Image potential in scanning transmission electron microscopy;Progress in Surface Science;2000-09

5. Characterizing the local nitrogen environment at platelets in type IaA/B diamond;Journal of Microscopy;1998-02

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