The effect of sputter deposition conditions on growth mechanism and microstructure of YBa2Cu3O7−x thin films on NdGaO3 substrates studied by scanning tunneling microscopy-Reference-Cited by-同舟云学术

The effect of sputter deposition conditions on growth mechanism and microstructure of YBa2Cu3O7−x thin films on NdGaO3 substrates studied by scanning tunneling microscopy

Published:1992-07 Issue: Volume:42-44 Page:705-714
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Hawley M.E.,Raistrick I.D.,Houlton R.J.,Garzon F.H.,Piza M.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

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4. R.E. Muenchausen, M. Hawley, S.R. Foltyn, X.D. Wu, R.C. Dye, F.H. Garzon and N.S. Nogar, Physica C, submitted.

5. Epitaxial and Smooth Films of a -Axis YBa 2 Cu 3 O 7

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