Author:
Van Landuyt J.,Van Tendeloo G.,Amelinckx S.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. Diffraction effects due to shear structures: A new method for determining the shear vector
2. Electron Microscopy of Thin Crystals;Hirsch,1965
3. Diffraction and Imaging Techniques in Materials Science;Amelinckx,1978
Cited by
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