Aspects of high resolution imaging with a scanning ion microprobe
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference30 articles.
1. A high‐intensity scanning ion probe with submicrometer spot size
2. SIMS micro-analysis with a gallium ion microprobe
3. Secondary Ion Mass Spectrometry SIMS V;Levi-Setti,1986
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