TEM studies of line defects in interfaces-Reference-Cited by-同舟云学术

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TEM studies of line defects in interfaces

Published:1989-06 Issue:1-2 Volume:30 Page:1-7
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Pond R.C.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Interfaces and dislocations;Pond,1985

2. Interfacial dislocations;Pond,1989

3. LXXXIII. Crystal dislocations.—Elementary concepts and definitions

4. Sur l'équilibre des corps élastiques multiplement connexes

5. International Tables for Crystallography,1983

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