High spatial resolution in stem x-ray microanalysis-Reference-Cited by-同舟云学术

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High spatial resolution in stem x-ray microanalysis

Published:1982-01 Issue:3 Volume:9 Page:311-318
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Thomas L.E.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Proc. 38th Annual Meeting of the Electron Microscopy Society of America;Thomas,1980

2. Scanning Electron Microscopy;Wells,1974

3. Performance of a field emission gun scanning electron microscope column

4. Adjustment of a STEM instrument by use of shadow images

5. Contribution to the contamination problem in transmission electron microscopy

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. TEM Applications of EELS;Electron Energy-Loss Spectroscopy in the Electron Microscope;2011

2. X-Ray Energy-Dispersive Spectrometry in Scanning Transmission Electron Microscopes;Scanning Transmission Electron Microscopy;2010-12-16

3. Experimental Gun Brightness Measurements on a 300 kV CFEG;Microscopy and Microanalysis;1998-07

4. X-Ray Spectrum Processing and Multivariate Analysis;Modern Developments and Applications in Microbeam Analysis;1998

5. The analysis of bainitic plates in Cu-Zn and Cr-Ni;Metallurgical Transactions A;1990-03

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