HREM imaging and microanalysis of a III-V semiconductor/oxide interface
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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3. InP-insulator interface structure studied by high resolution transmission electron microscopy;Journal of Crystal Growth;1990-01
4. Atom probe studies of the composition of low‐temperature oxides on (100) silicon and gallium arsenide surfaces;Journal of Applied Physics;1989-06-15
5. On the Use of Electron Microscopy in the Study of Semiconductor Interfaces;Springer Proceedings in Physics;1987
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