Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
5 articles.
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1. TEM Applications of EELS;Electron Energy-Loss Spectroscopy in the Electron Microscope;2011
2. Stationary Beam Methods;Electron Microscopy;2007-12-23
3. LOW ENERGY POINT REFLECTION ELECTRON MICROSCOPY;Surface Review and Letters;1997-06
4. C60-Related Tubules and Spherules;Science of Fullerenes and Carbon Nanotubes;1996
5. Energy-Filtered Reflection Electron Microscopy;Springer Series in Optical Sciences;1995