Prospects for high-resolution electron energy-loss experiments with the scanning transmission electron microscope-Reference-Cited by-同舟云学术

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Prospects for high-resolution electron energy-loss experiments with the scanning transmission electron microscope

Published:1985-01 Issue:1-4 Volume:18 Page:125-129
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Batson P.E.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Scanning Electron Microscopy/1984;Batson,1985

2. Proc. 42nd Annual EMSA Meeting;Batson,1984

3. Field Emission and Field Ionization;Gomer,1961

4. Evidence of Electron-Electron Scattering from Field Emission

5. Field-Emission Studies of Electronic Energy Levels of Adsorbed Atoms

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Erratum: “Determination of the complex dielectric function of epitaxial SrTiO3 films using transmission electron energy-loss spectroscopy” [J. Appl. Phys. 85, 2828 (1999)];Journal of Applied Physics;1999-07-15

2. Determination of the complex dielectric function of epitaxial SrTiO3 films using transmission electron energy-loss spectroscopy;Journal of Applied Physics;1999-03

3. Elements of a Transmission Electron Microscope;Transmission Electron Microscopy;1997

4. Semiclassical model for the inelastic scattering probability of electrons traveling parallel to four dielectric layers;Journal of Applied Physics;1994-09-15

5. Analytical Electron Microscopy;Transmission Electron Microscopy;1993

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