Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference23 articles.
1. The Physics of SiO2 and its Interfaces;Krivanek,1979
2. Seeing order in ‘amorphous’ materials
3. F.M. Ross and W.M. Stobbs, Phil. Mag. (a), in press.
4. A TEM fresnel diffraction-based method for characterizing thin grain-boundary and interfacial films
5. Proc. Analytical Electron Microscopy Workshop;Ross,1988
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