Cation-diffusion-induced characteristic beam damage in transmission electron microscope images of micas
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference25 articles.
1. Specimen damage caused by the beam of the transmission electron microscope, a correlative reconsideration
2. A STUDY OF MASS LOSS AND PRODUCT FORMATION AFTER IRRADIATION OF SOME DRY AMINO ACIDS, PEPTIDES, POLYPEPTIDES AND PROTEINS WITH AN ELECTRON BEAM OF LOW CURRENT DENSITY
3. Introduction to Analytical Electron Microscopy;Hall,1979
4. Introduction to Analytical Electron Microscopy;Glaeser,1979
5. Radiation damage in electron microscopy of inorganic solids
Cited by 32 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Defect-controlled Ar40 diffusion-domain structure of white micas from high-resolution Ar40/Ar39 crystal-mapping in slowly-cooled muscovite;Geochimica et Cosmochimica Acta;2023-02
2. Bizarre artefacts in transmission electron microscopy preparation and observation of geological samples;European Journal of Mineralogy;2019-12-20
3. Coexisting nanoscale phases of K-illite, NH4,K-illite and NH4-illite-smectite: an organic nitrogen contribution in the hydrothermal system of Harghita Bãi, East Carpathians, Romania;Clay Minerals;2019-03
4. Ripplocations provide a new mechanism for the deformation of phyllosilicates in the lithosphere;Nature Communications;2019-02-15
5. Retracted Article: Self-limited growth of Pr3+-doped LaF3 nanocrystals in oxyfluoride glass and glass-ceramics;RSC Advances;2017
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3