A high-resolution electron microscopy study of vanadium deposited on the basal plane of sapphire-Reference-Cited by-同舟云学术

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A high-resolution electron microscopy study of vanadium deposited on the basal plane of sapphire

Published:1993-12 Issue:3-4 Volume:52 Page:421-428
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Ikuhara Y.,Pirouz P.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Metal-Ceramics Interfaces;Pirouz,1990

2. Proc. Int. Symp. on Metal-Ceramic Interfaces,1992

3. Electron microscopy studies of defects at diffusion-bonded Nb/Al2O3 interfaces

4. HRTEM study of a Cu/Al2O3interface

5. Preliminary high-resolution electron microscopy study of (1120) oriented Al2O3–Fe interfaces

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