Atomic imaging using the dark-field annular detector in the stem
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. The study of the adsorption and diffusion of heavy atoms on light element substrates by means of the atomic resolution stem
2. Physical Aspects of Electron Microscopy and Microbeam Analysis;Crewe,1975
3. Scanning transmission electron microscopy of thin specimens
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