Quantitative surface microanalysis of samples with extreme topography utilising image interpretation by scatter diagrams and principal component analysis-Reference-Cited by-同舟云学术

Quantitative surface microanalysis of samples with extreme topography utilising image interpretation by scatter diagrams and principal component analysis

Published:1996-07 Issue:3-4 Volume:63 Page:193-203
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Barkshire I.R.,Kenny P.G.,Fletcher I.W.,Prutton M.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Three-dimensional scatter diagrams: application to surface analytical microscopy

2. Image analysis and chemical information in images

3. A third-generation Auger microscope using parallel multispectral data acquisition and analysis

4. Scatter diagrams and hotelling transforms: application to surface analytical microscopy

5. Slow electron scattering from metals

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