Test specimens for a dark field stem imaging: Measuring lattice spacing and electron probe size of a STEM and testing visibility of atoms of various atomic numbers-Reference-Cited by-同舟云学术

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Test specimens for a dark field stem imaging: Measuring lattice spacing and electron probe size of a STEM and testing visibility of atoms of various atomic numbers

Published:1980-01 Issue:1-3 Volume:5 Page:325-332
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Ohtsuki M.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. A scanning microscope with 5 Å resolution

2. Proc. 37th Annual EMSA Meeting;Kubozoe,1979

3. Resolution and Contrast in the Scanning Transmission Electron Microscope;Crewe,1975

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Transmission Electron Microscopy;Handbook of Surface and Interface Analysis;2009-06-24

2. Chapter 1 The Work of Albert Victor Crewe on the Scanning Transmission Electron Microscope and Related Topics;Advances in Imaging and Electron Physics;2009

3. High-resolution scanning transmission electron microscopy;Ultramicroscopy;1993-12

4. Ultrastructure of ferritin and apoferritin: A review;Micron;1993-01

5. Imaging with high-angle scattered electrons and secondary electrons in the STEM;Ultramicroscopy;1991-08

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