Thickness dependence of signal/background ratio of inner-shell electron excitation loss in eels
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Scattering angle dependence of signal/background ratio of inner-shell electron excitation loss in eels
2. Measurement of partial specific thickness (net thickness) of critical-point-dried cultured fibroblast by energy analysis
3. Proc. 38th Annual EMSA Meeting;Zaluzec,1980
4. Study of boron nitride by electron energy-loss spectroscopy
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