A new concept of theoretical resolution of an optical system, comparison with experiment and optimum condition for a point source
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. Electron Gun Using a Field Emission Source
2. Point cathodes for use in virtual source electron optics
3. Calculation of the heat-affected zone during pulsed electron-beam machining
4. Theory of Aberration Mixing in Electron-Optical Systems
5. Electron Optics of an Electron-Beam Lithographic System
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