Probabilistic logical approach for testing diagnosability of stochastic discrete event systems-Reference-Cited by-同舟云学术

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Probabilistic logical approach for testing diagnosability of stochastic discrete event systems

Published:2016-08 Issue: Volume:53 Page:53-61
ISSN:0952-1976
Container-title:Engineering Applications of Artificial Intelligence
language:en
Short-container-title:Engineering Applications of Artificial Intelligence

Author:

Geng Xuena,Ouyang Dantong,Zhao Xiangfu,Hao Shuang

Funder

NSFC

Jilin Province Science and Technology Development Plan

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Artificial Intelligence,Control and Systems Engineering

Reference19 articles.

1. Biere, A., Cimatti, A., Clarke, E., 1999. Symbolic model checking without bdds. In: Proceedings of the 5th International Conference on Tools and Algorithms for the Construction and Analysis of Systems, pp. 193–207

2. Computing of minimal event bases that ensure diagnosability;Carlos;Discrete Event Dyn. Syst.,2012

3. Polynomial test for stochastic diagnosability of discrete-event systems;Chen;IEEE Trans. Autom. Sci. Eng.,2013

4. Chen, J., Kumar, R., 2013. Decentralized failure diagnosis of stochastic discrete event system. In: Proceedings 9th IEEE International Conference on Automation Science and Engineering, pp. 1083–1088.

5. A computing procedure for quantification theory;Davis;J. ACM,1960

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