1. “Nondestructive Determination of Thickness and Perfection of Silica Films,”;Murray;J. Electrochem. Soc.,1966
2. “Quantitative Determination of the Carrier Concentration Distribution in Semiconductors by Scanning IR Absorption: Si,”;Jastrzeske;J. Electrochem. Soc.,1979
3. “Optical Measurement of Carrier Profiles in Silicon,”;Motooka;J. Electrochem. Soc.,1984
4. “Oxygen and Carbon Measurements on Silicon Slices by the IR Method,”;Stallhofer;Solid State Technology,1983
5. “A Silicon-Thermopile-Based Infrared Sensing Array for use in Automated Manufacturing,”;Choi;IEEE Tran. Electron Devices,1986