X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry study of anion incorporation in anodically grown films-Reference-Cited by-同舟云学术

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X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry study of anion incorporation in anodically grown films

Published:1988-12 Issue:1-2 Volume:167 Page:245-254
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Magnussen N.,Quinones L.,Cocke D.L.,Schweikert E.A.,Patnaik B.K.,Leite C.V.Barros,Baptista G.B.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. The incorporation of electrolyte byproducts into barrier anodic Al2O3 coatings

2. Direct observation of the duplex nature of anodic barrier films on aluminum

3. Electron-Beam-Induced crystallization of anodic barrier films on aluminium

4. Planar Models for Alumina-Based Catalysts

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Photocatalytic properties of in situ doped TiO2-nanotubes grown by rapid breakdown anodization;Catalysis Science & Technology;2013

2. Passive film breakdown during anodic oxidation of zirconium in pH 8 buffer containing chloride and sulfate;Electrochimica Acta;2001-08

3. Cyclic voltammetry, x-ray photoelectron spectroscopy, secondary-ion-mass spectrometry, and ion-scattering spectrometry examination of zirconium passive film breakdown in the presence of sulfate;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2000-07

4. Dielectric breakdown processes in anodic Ta2O5 and related oxides;Journal of Materials Science;1991-01-01

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