Investigation of amorphous Ni0.60Nb0.40 diffusion barriers-Reference-Cited by-同舟云学术

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Investigation of amorphous Ni0.60Nb0.40 diffusion barriers

Published:1987-07 Issue:2-3 Volume:150 Page:245-252
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Thomas R.E.,Guo K.J.,Aaron D.B.,Dobisz E.A.,Perepezko J.H.,Wiley J.D.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Proc. High Temperature Electronics and Instrumentation Conf.;Guo,1982

2. Amorphous thin film diffusion barriers on GaAs and InP

3. Stability of amorphous Fe-W alloys in multilayer metallizations on silicon

4. Special aspects of diffusion in thin films

5. Interaction of Pd–Er alloys with silicon

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