Optical properties of the thermal oxide-GaAs rough interface
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. The physical structure of the interface between single-crystal GaAs and its oxide film
2. Anodic Oxide on GaAs : Quantitative Chemical Depth Profiles Obtained Using Auger Spectroscopy and Neutron Activation Analysis
3. Surface Roughness Studies of Native Oxides of GaAs
4. In Situ Measurement and Analysis of Plasma‐Grown GaAs Oxides with Spectroscopic Ellipsometry
5. Chemical composition and formation of thermal and anodic oxide/III–V compound semiconductor interfaces
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1. Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh–Rice theory and Yeh matrix formalism;Physica Scripta;2020-08-17
2. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory;Journal of Modern Optics;2018-06-13
3. Optical Characterization of Thin Films Exhibiting Defects;Optical Characterization of Thin Solid Films;2018
4. Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory;Applied Surface Science;2017-10
5. Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces;Optics Communications;2005-04
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