High resolution studies of interfacial effects by small and large angle X-ray diffraction-Reference-Cited by-同舟云学术

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High resolution studies of interfacial effects by small and large angle X-ray diffraction

Published:1991-10 Issue:2 Volume:204 Page:473-484
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Gładyszewski Grzegorz

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference24 articles.

1. Synthetic Modulated Structures,1985

2. Metallic Superlattices—Artificially Structured Materials;Shinjo,1987

3. Physics, Fabrication and Applications of Multilayered Structures;Falco,1988

4. Molecular Beam Epitaxy—Fundamental and Current Status;Herman,1989

5. Vacuum Deposition of Thin Films;Holland,1956

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