Artifacts in SPM measurements of thin films and coatings-Reference-Cited by-同舟云学术

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Artifacts in SPM measurements of thin films and coatings

Published:1995-12 Issue:1-2 Volume:270 Page:356-361
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Lenihan T.G.,Malshe A.P.,Brown W.D.,Schaper L.W.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Artifacts in SPM,1993

2. How to Buy a Scanning Probe Microscope,1993

3. Scanning tunneling microscopy;Hansma;J. Appl. Phys.,1987

4. 7 ways to weed out artifacts in SPM images;Cassidy;Res. Dev. Mag.,1994

5. Atomic-Scale Friction Measurements Using Friction Force Microscopy: Part I—General Principles and New Measurement Techniques

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