Author:
De Angelis Robert J.,Jacob Robert J.,Funk James E.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Quality and reliability assurance of semiconductor devices through transmission electron microscopy;Pinizzoto,1986
2. Purity and morphology of aluminum films;Dhere;Thin Solid Films,1975
3. The morphology of thick evaporated aluminum films and their purity as determined by proton-induced X-ray analysis;Dhere;Thin Solid Films,1977
4. Deposition of aluminum from an electron beam source;Graper;J. Vac. Sci. Technol.,1972
5. Growth of large crystalline grain Al thin films on amorphous substrates;Sberveglieri,1988
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献