Real-time and spectroscopic ellipsometry characterizatio of diamond and diamond-like carbon-Reference-Cited by-同舟云学术

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Real-time and spectroscopic ellipsometry characterizatio of diamond and diamond-like carbon

Published:1989-12 Issue:1-2 Volume:181 Page:565-578
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Collins R.W,Cong Y,Kim Y.-T,Vedam K,Liou Y,Inspektor A,Messier R

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Growth of Diamond and Graphite from the Gas Phase;Derjaguin,1977

2. Vapor Deposition of Diamond Particles from Methane

3. Diamond synthesis from gas phase in microwave plasma

4. Diamond synthesis from methane-hydrogen-water mixed gas using a microwave plasma

Cited by 32 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. In situ spectroscopic ellipsometry monitoring of diamond multilayers grown by microwave plasma enhanced chemical vapor deposition;Diamond and Related Materials;2018-06

2. Spectroscopic Ellipsometry of Nanocrystalline Diamond Film Growth;ACS Omega;2017-10-16

3. Spectroscopic ellipsometry of homoepitaxial diamond multilayers and delta-doped structures;Applied Physics Letters;2014-01-13

4. Interface analysis of CVD diamond on TiN surfaces;Applied Surface Science;2000-05

5. Modeling Chemical Vapor Deposition (CVD) Diamond Film Growth with Diamantane-Derived Radicals in Solution: Permissive Evidence in Support of the Garrison−Brenner Mechanism for Incorporation of Carbon into the Dimer Sites of the {100} Diamond Surface;The Journal of Organic Chemistry;1999-09-14

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