Determination of optical constants and average thickness of inhomogeneous-rough thin films using spectral dependence of optical transmittance
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film
2. Optical constants of rf sputtered hydrogenated amorphous Si
3. Determination of the thickness and optical constants of amorphous silicon
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