Acoustic microscopy investigation of porous silicon-Reference-Cited by-同舟云学术

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Acoustic microscopy investigation of porous silicon

Published:1995-01 Issue:1-2 Volume:255 Page:155-158
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Da Fonseca R.J.M.,Saurel J.M.,Foucaran A.,Massone E.,Taliercio T.,Camassel J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

2. FIPOS (Full Isolation by Porous Oxidized Silicon) technology and its application to LSI's

3. Molecular beam epitaxial growth of CoSi2 on porous Si

4. Optical absorption in porous silicon of high porosity

5. Acoustic Microscopy;Briggs,1992

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of ultrasonic absorption in the MHz frequency range by silicon substrates with a built-in porous silicon layer;Ultrasonics;2019-07

2. Acoustic doorway states in layered porous silicon structures;Superlattices and Microstructures;2018-09

3. Acoustic identification of the elastic properties of porous and nonporous superconducting materials DyBa2-XSrXCu3O7-δ;Journal of Physics: Conference Series;2018-05

4. Microscopy of Porous Silicon;Handbook of Porous Silicon;2018

5. Acoustic Characterization of Porous Silicon;Handbook of Porous Silicon;2018

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