A study of the d.c. electrical properties of thin films of the co-evaporated dielectric system SiO/TiO-Reference-Cited by-同舟云学术

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A study of the d.c. electrical properties of thin films of the co-evaporated dielectric system SiO/TiO

Published:1975-06 Issue:2 Volume:27 Page:319-327
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Bidadi H.,Hogarth C.A.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Electrical forming in and electron emission from thin film aluminium-borosilicate glass-aluminium sandwiches

2. Some electrical properties of thin film copper–borosilicate glass–copper sandwiches intended for use as electron emitters

3. Proc. Int. Conf. on the Physics of Semiconductors;Hogarth,1968

4. A model for filament growth and switching in amorphous oxide films

5. Electrical Breakdown in Thin Dielectric Films

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electronic properties of Cu/SiO2/Cu structures at different temperatures;Journal of Non-Crystalline Solids;2007-04

2. Polarity-dependent memory switching effects in the Ti/CdxPb1-xS/Ag system;Semiconductor Science and Technology;1995-03-01

3. Electroforming in MIM structure of SiOx and SiOx/SnO composite dielectric thin films;Journal of Materials Science;1992-01-01

4. Electrical conduction through co-evaporated SiOx-SnO thin films;Journal of Materials Science;1990-06

5. Some optical and structural studies on SiO/SnO2 thin films;Physica Status Solidi (a);1987-02-16

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