Studies of the temperature dependence of the dielectric breakdown field in molecular Langmuir films-Reference-Cited by-同舟云学术

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Studies of the temperature dependence of the dielectric breakdown field in molecular Langmuir films

Published:1975-05 Issue:1 Volume:27 Page:49-62
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Agarwal D.K.,Srivastava V.K.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference41 articles.

1. Langmuir-Blodgett Multi-monolayers as Thin Film Dielectrics

2. Electrical and Structural Properties of Langmuir Films

3. Thickness dependence of breakdown field in thin films

4. Thickness dependence of breakdown field

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. References;Surface Chemistry Essentials;2013-11-26

2. Organometallic Langmuir-Blodgett films for electronics and photonics;Applied Organometallic Chemistry;1992-12

3. APPLICATIONS OF LB AND SA FILMS;An Introduction to Ultrathin Organic Films;1991

4. Potential Applications of Langmuir-Blodgett Films;Langmuir-Blodgett Films;1990

5. Characterization and Properties;Langmuir-Blodgett Films;1990

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