Thickness gauging through the ratio of x-ray fluorescence lines

Author:

Rosner B.,Notea A.,Segal Y.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Radioisotope X-ray fluorescence spectrometry,1970

2. Applications of Low Energy X- and Gamma-Rays;Cameron,1971

3. Radioisotope Measurement Applications in Engineering;Gardner,1967

4. Gamma Gauge for the Control of Interzone Layer in an Extraction Tower

5. A. Notea and Y. Segal, A general approach to the design of radiation gauges, Nucl. Technol., to be published.

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Thickness measurements of thin films: comparison of techniques using characteristic X-ray line ratio techniques;Thin Solid Films;1992-07

2. A phenomenological inversion approach for the evaluation and analysis of NDT measurement systems;NDT International;1988-12

3. Resolving power of radioactive solution level gauging;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1986-11

4. Resolving Power of Dynamic Radiation Gauges;Nuclear Technology;1983-10

5. Nucleonic instrumentation applied to the measurement of physical parameters by means of ionising radiation;Journal of Physics E: Scientific Instruments;1982-09

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